Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments-Reference-Cited by-同舟云学术

Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments

Published:2017-11 Issue: Volume:78 Page:11-16
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Sajid Muhammad,Chechenin N.G.,Torres Frank Sill,Gulzari Usman Ali,Butt Muhammad Usman,Ming Zhu,Khan E.U.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Latch-up test measurement for long duration space missions;Sterpone,2012

2. Modeling the Space Radiation Environment and Effects on Microelectronic Devices and Circuits,2006

3. Robust modular bulk built-in current sensors for detection of transient faults;Torres,2012

4. Radiation effects on spacecraft materials;Novikov;J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech.,2009

5. (2009 01 Jan 2016). International Technology Roadmap of Semiconductors. Available: http://www.itrs.net

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