Effective scan chain failure analysis method-Reference-Cited by-同舟云学术

Effective scan chain failure analysis method

Published:2017-09 Issue: Volume:76-77 Page:201-213
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Auvray Etienne,Armagnat Paul,Saury Luc,Jothi Maheshwaran,Brügel Michael

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. FASTKIT: a software tool for easy design visibility and diagnostic enhancement for failure analysis;Auvray,2015

2. Timing failure debug using debug-friendly scan patterns and TRE;Burmer,2008

3. Scan chain diagnosis by adaptive signal profiling with manufacturing ATPG patterns;Huang,2009

4. Failure analysis enhancement by incorporating a compact scan diagnosis system;Estores,2014

5. Software-enabled design visibility enhancement for failure analysis process improvement;Yen,2009

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