Thermoelectrical modelling and simulation of devices based on VO2-Reference-Cited by-同舟云学术

Thermoelectrical modelling and simulation of devices based on VO2

Published:2017-12 Issue: Volume:79 Page:387-394
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pohl László,Ur Soma^ORCID,Mizsei János

Funder

Hungarian Scientific Research Fund

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. The law that's not a law;Moore;IEEE Spectr.,2015

2. Benchmarking of beyond-CMOS exploratory devices for logic integrated circuits;Nikonov;IEEE J. Explor. Solid State Comput. Devices Circuits,2015

3. Thermal-electronic integrated logic;Mizsei,2013

4. Metal-insulator transition in vanadium dioxide

5. Universality and critical behavior at the Mott transition;Limelette;Science,2003

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