Refined metastability characterization using a time-to-digital converter-Reference-Cited by-同舟云学术

Refined metastability characterization using a time-to-digital converter

Published:2018-01 Issue: Volume:80 Page:91-99
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Polzer Thomas,Huemer Florian,Steininger Andreas

Funder

Austrian Science Fund

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

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4. Anomalous behavior of synchronizer and arbiter circuits;Chaney;IEEE Trans. Comput.,1973

5. Timing measurements of synchronization circuits;Semiat,2003

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3. An Experimental Study of Metastability-Induced Glitching Behavior;Journal of Circuits, Systems and Computers;2019-12-01

4. Recent Developments and Challenges in FPGA-Based Time-to-Digital Converters;IEEE Transactions on Instrumentation and Measurement;2019-11

5. Using a Duplex Time-to-Digital Converter for Metastability Characterization of an FPGA;2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2018-04