Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Anthology of the development of radiation transport tools as applied to single event effects;Reed;IEEE Trans. Nucl. Sci.,2013
2. Rate prediction for single event effects - a critique;Petersen;IEEE Trans. Nucl. Sci.,1992
3. Effect of the ion mass and energy on the response of 70-nm SOI transistors to the ion deposited charge by direct ionization;Raine;IEEE Trans. Nucl. Sci.,2010
4. The impact of delta-rays on single-event upsets in highly scaled SOI SRAMs;King;IEEE Trans. Nucl. Sci.,2010
5. A functional 0.69 μm2 embedded 6T-SRAM bit cell for 65 nm CMOS platform;Arnaud,2003
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献