Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation-Reference-Cited by-同舟云学术

Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation

Published:2008-08 Issue:8-9 Volume:48 Page:1354-1360
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Deshayes Y.,Bord I.,Barreau G.,Aiche M.,Moretto P.H.,Béchou L.,Roehrig A.C.,Ousten Y.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

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4. Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes;Pursiainen;Appl Phys Lett,2001

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