High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization

Author:

Johannessen Rolf,Oldervoll Frøydis,Strisland Frode

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Metallurgical bonding systems for high-temperature electronics;Harman,1999

2. Oldervoll F, Strisland F. Long term reliability of aluminium wire-bonding on ceramic substrate at high temperature. In: Proceedings from the international high temperature conference on high temperature electronics HITEN 2003, Oxford UK, 8–11 July; 2003. p. 165–72.

3. Intermetallic formation in gold–aluminium systems;Philofsky;Solid-State Electron,1970

4. Shuckla R, Deo JS. Reliability hazards of silver–aluminium substrate bonds in MOS devices. In: Proceeding of the 20th annual IEEE reliability physics symposium; 1982. p. 122–7.

5. High temperature aluminium nitride packaging in high-temperature electronics;Martin,1998

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