Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach-Reference-Cited by-同舟云学术

Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach

Published:2009-02 Issue:2 Volume:49 Page:199-208
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Seyyed Mahdavi S.J.,Mohammadi K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

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4. Survey of test vector compression techniques;Touba;IEEE Des Test Comput,2006

5. Manjunath KS, Whitaker S. Optimal test set for stuck-at faults in VLSI. In: Proceedings of first Great lakes symposium on VLSI, USA: Kalamazoo, MI; 1991. p. 104–9.

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