Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
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2. Cost effective outliers screening with moving limits and correlation testing for analogue IC’s;Fang;Proc Int Test Conf,2007
3. Defect-oriented testing of mixed-signal ICs: some industrial experience;Xing;Proc Int Test Conf,1998
Cited by
11 articles.
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