Author:
Habibi Mehdi,Pourmeidani Hossein
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Molecular electronics: devices, systems and tools for gigagate, gigabit chips;Butts;ICCAD,2002
2. A process-tolerant cache architecture for improved yield in nanoscale technologies;Agarwal,2005
3. Chen L, Dey S, Sanchez P, Sekar K, Chen Y. Embedded hardware and software self-testing methodologies for processor cores. In: Proceeding of the 37th Design Automation Conference. 2000. p. 625–30.
4. Seyyed Mahdavi SJ, Mohammadi K. Reliability enhancement of digital combinational circuits based on evolutionary approach. Microelectron Reliability. 2010. p. 415–23.
5. Rohani A, Zarandi HR. Two effective methods to mitigate soft error effects in SRAM-based FPGAs. Microelectron Reliability. 2010. p. 1171–80.
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1 articles.
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