SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance-Reference-Cited by-同舟云学术

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SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance

Published:2014-01 Issue:1 Volume:54 Page:71-78
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ker Ming-Dou,Lin Wan-Yen,Yen Cheng-Cheng

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference35 articles.

1. Full-wave simulation of an electrostatic discharge generator discharging in air-discharge mode into a product;Liu;IEEE Trans Electromagn Compat,2011

2. Investigations on the susceptibility of ICs to power-switching transients;Musolino;IEEE Trans Power Electron,2010

3. A nonlinear microcontroller power distribution network model for the characterization of immunity to electrical fast transients;Koo;IEEE Trans Electromagn Compat,2009

4. Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (ESD) problems;Muchaidze;IEEE Trans Electromagn Compat,2008

5. Modeling the IEC 61000-4-4 EFT injection clamp;Musolino;IEEE Trans Electromagn Compat,2008

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