Author:
Azambuja José Rodrigo,Brown Gustavo,Kastensmidt Fernanda Lima,Carro Luigi
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference33 articles.
1. Trends and challenges in VLSI circuit reliability;Constantinescu;IEEE Micro,2003
2. Reflections on the memory wall;McKee;Proc Conf Comput Front,2004
3. Chakraborty K, Mazumder P. Fault-tolerance and reliability tech-niques for high-density random-access memories, ed. Prentice Hall PTR, ISBN 978-0130084651; 2002.
4. Defect tolerance in VLSI circuits: techniques and yield analysis;Koren;Proc IEEE,1998
5. A logic-in-memory computer;Stone;IEEE Trans Comput,1970