Author:
Belaïd M.A.,Ketata K.,Gares M.,Mourgues K.,Masmoudi M.,Marcon J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Operating limits for power amplifiers at high junction temperatures;Radivojevic;Microelectron Reliab,2004
2. Characterization and modelling of power RF LDMOS transistor including self-heating effects;Belaïd;16th Int Conf Microelectron,2004
3. Characterization and modelling of SOI varactors at various temperatures;Kun-Ming;IEEE T Electron Dev,2004
4. Comparative study of thermal cycling and thermal shocks tests on electronic components reliability;Moreau;Microelectron Reliab,2004
5. Sischka R. The IC-CAP characterization and modeling handbook. Agilent Technologies, Dept EEsof, Munich; 2002.
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