Failure analyses for debug and ramp-up of modern IC’s-Reference-Cited by-同舟云学术

Failure analyses for debug and ramp-up of modern IC’s

Published:2006-09 Issue:9-11 Volume:46 Page:1486-1497
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Burmer Christian,Görlich Siegfried

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

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4. Nguyen D, To T, Harrison R, Phan C, Drummond J. Dallas Device Analysis Operation. Dallas, Texas: Texas Instruments, Inc.; Proc 30th ISTFA 2004:103–8.

5. Fleuren EM. Avery Sensitive, Simple Analysis Technique using Nematic Liquid Crystals. Proc IEEE IRPS 1983.

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