Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations-Reference-Cited by-同舟云学术

Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations

Published:2007-12 Issue:12 Volume:47 Page:2215-2225
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Keimasi Mohammadreza,Azarian Michael H.,Pecht Michael

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Capacitance monitoring while flex testing;Prymak;IEEE Transactions on Components Packag Manufact Technol Part A,1995

2. Syfer Technology Limited. FlexiCap™ termination. Application Note, Reference number: AN0001 – FlexiCap™, Issue 3, www.syfer.com [visited on June 2006].

3. Syfer Technology Limited. The effect of lead free soldering on bend test performance. Application Note, Reference number: AN0010 – Lead free bend test performance, Issue 1, www.syfer.com [visited on June 2006].

4. Nicker, D. Bend it, shape it, don’t break it. Passive Component Industry, Paumanok Publications Inc.; March/April 2003. p. 18–21.

5. Stewart M. AVX MLCC Flexiterm: guarding against capacitor crack failures. AVX Corporation, Technical Information, www.avxcorp.com [visited on June 2006].

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