Failure Analysis-assisted FMEA-Reference-Cited by-同舟云学术

Failure Analysis-assisted FMEA

Published:2006-09 Issue:9-11 Volume:46 Page:1795-1799
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Cassanelli G.,Mura G.,Fantini F.,Vanzi M.,Plano B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference3 articles.

1. IEC 60812 Edition 2.0: Analysis techniques for system reliability—Procedure for failure mode and effects analysis (FMEA).

2. Vanzi M. The rules of the Rue Morgue. Proc ASM International ISTFA 95, Santa Clara (CA) 1995, p. 249–56.

3. Mura G, Vanzi M, Cassanelli G, Fantini F. The Rules of the Rue Morgue: a decade later. Proc. IPFA 06, Singapore (in press).

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