Author:
Vaghef Vahid Hamiyati,Peiravi Ali
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference43 articles.
1. Fundamental limits of silicon technology;Keyes;Proc IEEE,2001
2. Designing reliable systems from unreliable components: the challenge of transistor variability and degradation;Borkar;IEEE Micro,2005
3. Reliability implications of bias-temperature instability in digital ICs;Park;IEEE Des Test Comput,2009
4. Schrimpf RD, et al. Reliability and radiation effects in IC technologies. In: IEEE 46th international reliability physics symposium (IRPS 2008). Phoenix, May 2008. p. 97–106.
5. Chip-level soft error estimation method;Nguyen;IEEE Dev Mater Reliab,2005
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