Author:
Ejlali Alireza,Ghassem Miremadi Seyed
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference35 articles.
1. Probabilistic Risk Assessment;Henley,1992
2. Vesely WE, Goldberg FF, Roberts NH, Haasl DF. Fault tree handbook. United States Nuclear Regulatory Commission, January 1981
3. Fault tree analysis methods and applications: a review;Lee;IEEE Trans. Reliab.,1985
4. Gulati R, Dugan JB. A modular approach for analyzing static and dynamic fault trees. In: Proc Ann Reliability & Maintainability Symp, Philadelphia, Pennsylvania, USA, January 1997. p. 57–63
5. Developing a low-cost high-quality software tool for dynamic fault-tree analysis;Dugan;IEEE Trans. Reliab.,2000
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