Author:
Paine Bruce M,Perham Timothy J,Thomas III Stephen
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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5. Paine BM, Thomas III S, Delaney MJ. Very-Low-temperature life tests on InP-based HBT's––An update. In: Proceedings of the GaAs Reliability Workshop. 2002. p. 119–136
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