Efficient parametric yield optimization of VLSI circuit by uniform design sampling method

Author:

Jing Ming-e,Hao Yue,Zhang Jin-feng,Ma Pei-jun

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Director SW, Feldmann P, Krishna K. Optimization of parametric yield: A tutorial. Proc IEEE Custom Integ Circuits Conf 1992;3.1.1–3.1.8

2. Meehan M. Understanding and maximizing yield through design centering [microwave circuits]. IEE Colloquium on Computer Based Tools for Microwave Engineers, 15 October 1991. p. 6/1–6/4

3. Say Wei Foo, Yu Lin. Hybrid method of tolerance design. Proc ICECS'99 Electron Circuits Syst 1999;1:557–60

4. Computationally efficient yield estimation procedures based on simplicial approximation;Director;IEEE Trans. CAS,1978

5. Kamal HA, Ayyub BM, Variance reduction techniques for simulation-based structural reliability assessment of systems. In: 8th Specialty Conference on Probabilistic Mechanics and Structural Reliability PMC2000-155

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