Author:
Tan Cher Ming,Gan Zhenghao,Ho Wai Fung,Chen Sam,Liu Robert
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Effect of carrier lifetime on the forward characteristics of high power devices;Choo;IEEE Trans. Electron. Dev,1970
2. High current characteristics of asymmetrical p–i–n diodes having low forward voltage drops;Naito;IEEE Trans. Electron. Dev,1976
3. S-type current–voltage characteristic and filamentation of the current in silicon n+–n–n+ structures with different contact areas;Blonskis;Sov. Phys. Semicond,1983
4. Current filaments in semiconductors;Barnett;IBM J. Res. Develop,1969
5. Direct extraction of diode parameters using lateral and vertical optimization;Ortiz-Conde;Solid State Electron,1999
Cited by
14 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献