Author:
Zimpeck A.L.,Meinhardt C.,Artola L.,Hubert G.,Kastensmidt F.L.,Reis R.A.L.
Funder
Office National d'études et de Recherches Aérospatiales
Conselho Nacional de Desenvolvimento Científico e Tecnológico
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Investigation on asymmetric dual-k spacer (ADS) trigate wavy FinFET: a novel device;Pradhan;International Conference on Devices, Circuits and Systems (ICDCS),2016
2. Communication theory in optical lithography;Rieger;Journal of Micro/Nano-Lithography, MEMS, and MOEMS,2012
3. Comparative soft error evaluation of layout cells in FinFET technology;Artola;Microelectron. Reliab.,2014
4. Variability analysis – prediction method for nanoscale triple gate FinFETs;Tassis;International Conference on Microelectronics Proceedings (MIEL),2014
5. Bulk FinFETs with body spacers for improving fin height variation;Wei;Solid State Electron.,2016
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy;2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS);2021-11-22
2. Process Variability Mitigation;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021
3. Circuit design using Schmitt Trigger to reliability improvement;Microelectronics Reliability;2020-11
4. Circuit Level Design Methods to Mitigate Soft Errors;2020 IEEE Latin-American Test Symposium (LATS);2020-03
5. Challenges in the Design of Integrated Systems for IoT;IFIP Advances in Information and Communication Technology;2020