Author:
Ye X.R.,Chen H.,Deng J.,Wu Y.,Liang H.M.,Zhai G.F.
Funder
National Natural Science Foundation
National Key R&D Program
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. The development of industrially-relevant computational electromagnetics based design tools;Lowther;IEEE Trans. Magn.,2013
2. The influence of magnetic material degradation on the optimal design parameters of electromagnetic devices;Abdallh;IEEE Trans. Magn.,2014
3. Di Barba, Paoloa Formisano, Alessandrob Martone, Raffaeleb Repetto, Maurizioc Salvini, Alessandrod Savini, Antonioa. A brief survey of robust optimization. Int. J. Appl. Electromagn. 56 (2018) 61–72.
4. Manufacturing process-based storage degradation modelling and reliability assessment;Ye;Microelectron. Reliab.,2018
5. A response-surface-based structural reliability analysis method by using non-probability convex model;Bai;Appl. Math. Model.,2014