Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers-Reference-Cited by-同舟云学术

Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers

Published:2019-08 Issue: Volume:99 Page:104-112
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Baeg Sanghyeon,Qasim Mirza,Kwon Junhyeong^ORCID,Li Tan,Gupta Nilay,Wen Shi-Jie,Kolli Satyadev

Funder

Cisco

National Research Foundation of Korea

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

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4. “Detecting and Mitigating Data-Dependent DRAM Failures by Exploiting Current Memory Content”, Proceedings of the 50th International Symposium on Microarchitecture (MICRO), Pp.27–40;Khan,2017

5. The reach profiler (REAPER): enabling the mitigation of DRAM retention failures via profiling at aggressive conditions;Patel,2017

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