Sense amplifier offset voltage analysis for both time-zero and time-dependent variability-Reference-Cited by-同舟云学术

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Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Published:2019-08 Issue: Volume:99 Page:52-61
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Agbo Innocent,Taouil Mottaqiallah,Kraak Daniël,Hamdioui Said,Weckx Pieter,Cosemans Stefan,Raghavan Praveen,Catthoor Francky,Dehaene Wim

Funder

RESIST European Project

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Trends and challenges of SRAM reliability in the nano-scale era;Khan,2010

2. Statistical modeling for the minimum standby supply voltage of a full SRAM array;Wang,2007

3. Microarchitecture and design challenges for gigascale integration;Borkar,2004

4. Reliability challenges of real-time systems in forthcoming technology nodes;Hamdioui,2013

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation and Optimization of Photoelectric Detection Circuit With a Differential Structure Suited to Borehole Optically Pumped Magnetometer;IEEE Sensors Journal;2024-07-01

2. Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16

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