Scaling the bulk-driven MOSFET into deca-nanometer bulk CMOS processes-Reference-Cited by-同舟云学术

Scaling the bulk-driven MOSFET into deca-nanometer bulk CMOS processes

Published:2011-04 Issue:4 Volume:51 Page:727-732
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Urban Christopher,Moon James E.,Mukund P.R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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