Author:
Bychikhin S.,Haberfehlner G.,Rhayem J.,Vanderstraeten D.,Gillon R.,Pogany D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Detection and optimisation of temperature distributions across large – area power MOSFETs to improve energy capability;Khemka;IEEE TED,2004
2. Pfost M, Joos J, Stecher M. Measurement and simulation of self-heating in DMOS transistors up to very high temperatures. In: Proc ISPSD; 2008. p. 209–12.
3. Denison M, Pfost M, Pieper KW, Märkl S, Metzner D, Stecher M. Influence of inhomogeneous current distributions on the thermal SOA of integrated DMOS transistors. In: Proc ISPSD; 2004. p. 409–12.
4. A temperature – gradient – induced failure mechanism in metallization under fast thermal cycling;Smorodin;IEEE TDMR,2008
5. Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling;Nguyen;Microelectron Reliab,2002
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献