Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success-Reference-Cited by-同舟云学术

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Published:2019-01 Issue: Volume:92 Page:136-142
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Zhao Lin,Goh S.H.,Chan Y.H.,Yeoh B.L.,Hu Hao,Thor M.H.,Tan Alan,Lam Jeffrey

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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5. Fault diagnosis in analog integrated circuits using artificial neural networks;Rathinam;Int. J. Comput. Appl.,2010

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