Author:
Quitadamo Matteo Vincenzo,Piumatti Davide,Raviola Erica,Fiori Franco,Sonza Reorda Matteo
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference36 articles.
1. Real-time temperature estimation for power MOSFETs considering thermal aging effects;Chen;IEEE Trans. Device Mater. Reliab.,2014
2. Remaining useful lifetime estimation for thermally stressed power MOSFETS based on on-state resistance variation;Dusmez;IEEE Trans. Ind. Appl.,2016
3. Thermal analysis approach for predicting power device lifetime;Russo;IEEE Trans. Device Mater. Reliab.,2019
4. Thermal and Power Management of Integrated Circuits;Vassighi,2006
5. Thermal fatigue life evaluation of CSP joints by mechanical fatigue testing;Kanda,2010
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