Author:
Hasegawa K.,Abe S.,Tsukuda M.,Omura I.,Ninomiya T.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Toward reliable power electronics: challenges, design tools, and opportunities;Wang;IEEE Ind. Electron. Mag.,2013
2. A literature review of IGBT fault diagnostic and protection methods for power inverters;Lu;IEEE Trans. Ind. Appl.,2009
3. A method of junction temperature estimation for SiC power MOSFETs via turn-on saturation current measurement;Yang;IEEJ J. Ind. Appl.,2019
4. Effects of power cycling test condition and test strategy on lifetime estimation of power modules in power electronic systems;Choi;Microelectron. Reliab.,2019
5. Alleviation technique for thermal concentration on power devices driving a PMSM under zero-speed and high-torque condition;Ayano;IEEJ J. Ind. Appl.,2020
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