Author:
Wu R.,Agbo S.N.,Mendy S.,Bashar E.,Jahdi S.,Gonzalez Ortiz,Alatise O.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Effect of parasitic inductance mismatch on short-circuit characterization of paralleled SiC MOSFETs;Zou,2019
5. Investigation of threshold voltage stability of SiC MOSFETs;Peters,2018
Cited by
11 articles.
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