Author:
Wang Hui,Lai Pengyu,Ali Muhammad,Fan Yanli,Dissegna Mariano,Boselli Gianluca,Chen Zhong
Funder
Semiconductor Research Corporation
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Basic ESD and I/O Design;Dabral,1998
2. E.A. Amerasekera, C. Duvvury, ESD in Silicon Integrated Circuits, (2002).
3. ESD: RF Technology and Circuits;Voldman,2006
4. ESD protection design with low-capacitance consideration for high-speed/high-frequency I/O interfaces in integrated circuits;Ker;Recent Patents on Engineering,2007
5. Electrostatic discharge sensitivity testing-human body model (HBM) component level;E.D. Association;ANSI/ESD STM5.,2000
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献