Author:
Danković D.,Davidović V.,Golubović S.,Veljković S.,Mitrović N.,Djorić-Veljković S.
Funder
Republic of Serbia Ministry of Education Science and Technological Development
Serbian Academy of Sciences and Arts
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference40 articles.
1. Fundamentals of Semiconductor Power Devices;Baliga,1999
2. Ionizing Radiation Effects in MOS Devices and Circuits;Ma,1989
3. Effects of electrical stressing in power VDMOSFETs;Stojadinovic;Microelectron. Reliab.,2005
4. Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing;Ristic;Appl. Surf. Sci.,2006
5. VDMOSFET HEF degradation modelling considering turn-around phenomenon;Ye;Microelectron. Reliab.,2018
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献