Analyzing and increasing soft error resilience of Deep Neural Networks on ARM processors-Reference-Cited by-同舟云学术

Analyzing and increasing soft error resilience of Deep Neural Networks on ARM processors

Published:2021-09 Issue: Volume:124 Page:114331
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Liu Zhi,Liu Yuhong,Chen Zhengming,Guo Gang,Wang Haibin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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