Author:
Xu Ke,Chen Xing,Zhou Lin,Duan Xin
Funder
National Natural Science Foundation of China
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Electro-thermal analysis of microwave limiter based on the time-domain impulse response method combined with physical-model-based semiconductor solver;Chen;IEEE Trans. Microwave Theory Tech.,2020
2. Damage accumulation mechanism in PIN diode limiters induced via multiple microwave pulses;Zhao;Sci. Rep.,2020
3. Robustness of PIN limiter diodes to an ESD event based on VF-TLP characterization;Marathe;IEEE Lett. Electromagn. Compat. Pract. Appl.,2019
4. PIN diode limiter spike leakage, recovery time, and damage;Tan;IEEE MTT-S Int. Microwave Symp. Dig.,1988
5. Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltages;Wunsch;IEEE Trans. Nucl. Sci.,1968
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献