Pitfalls for transient response analysis with VF-TLP-Reference-Cited by-同舟云学术

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Pitfalls for transient response analysis with VF-TLP

Published:2021-10 Issue: Volume:125 Page:114309
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Smedes Theo,Coenen Mart,Sluiter Sander,Cappon Paul

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Transmission Line Pulse (TLP) –Device Level,2016

2. Transmission Line Pulse (TLP) –User and Application Guide,2018

3. Harmful voltage overshoots due to turn-on behaviour of ESD protections during fast transients;Smedes,2007

4. CDM protection design for CMOS applications using RC-triggered rail clamps;Stockinger;Proceedings EOS/ESD Symposium,2009

5. Calibration of very fast TLP transients;Linten;Proceedings EOS/ESD Symposium,2009

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