Author:
De Sio C.,Azimi S.,Sterpone L.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Analysis of single event effects on embedded processor;Azimi,2021
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3. SEU evaluation of hardened-by-replication software in RISC-V soft processor;De Sio,2021
4. Radiation specification and testing of heterogenous microprocessor SOCs;Guertin,2019
5. Quantitative evaluation of soft error injection techniques for robust system design;Cho,2013
Cited by
2 articles.
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