Author:
Du H.,Bayarsaikhan Y.,Omura I.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Review of methodologies for evaluating short-circuit robustness and reliability of SiC power MOSFETs;Cui;IEEE J. Emerg. Sel. Top. Power Electron.,2021
2. A discussion on IGBT short-circuit behavior and fault protection schemes;Chokhawala;IEEE Trans. Ind. Appl.,1995
3. Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis;Du;Microelectron. Reliab.,2020
4. A literature review of IGBT fault diagnostic and protection methods for power inverters;Lu;IEEE Industry Applications Society Annual Meeting,2008
5. Integrated switch current sensor for short circuit protection and current control of 1.7-kV SiC MOSFET modules;Wang;IEEE Energy Conversion Congress and Exposition (ECCE),2016
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献