A HCI-hardened self-healing operational amplifier circuit-Reference-Cited by-同舟云学术

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A HCI-hardened self-healing operational amplifier circuit

Published:2023-12 Issue: Volume:151 Page:115251
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Zhang Jun-an,Hu Jinxin,Jiang Min,Xiao Yi,Li Tiehu,Lu Yunhua,Zhang Qingwei

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Surrogate-model-based analysis of analog circuits—part II: reliability analysis;Yelten;IEEE Trans. Device Mater. Reliab.,2011

2. Cross-layer investigation of continuous-time sigma–delta modulator under aging effects[J];Cai;Microelectron. Reliab.,2015

3. Linear and resolution adjusted on-chip aging detection of NBTI degradation;Li;IEEE Trans. Device Mater. Reliab.,2018

4. Review: analog design methodologies for reliability in nanoscale CMOS circuits;Afacan,2017

5. Implementation of a low noise amplifier with self-recovery capability;Liu;IEEE Access,2019

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