Author:
Nagalingam D.,Quah A.C.T.,Moon S.J.,Parab S.M.,Ng P.T.,Ting S.L.,Ma H.H.,Chen C.Q.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits;Roy;Proc. IEEE,2003
2. Power Efficient System Design;Panda,2010
3. Focused Ion Beam Circuit Edit Becomes Increasingly Valuable in High-Stakes World of Advanced Node Design. EAG. Inc. 2014, M-001416 (02.14).
4. Application of FIB Circuit Edit and Electrical Characterization in Failure Analysis for Invisible Defect Issues;Song,2006
5. Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis;Wen,2011
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献