Author:
Wang Zhian,Li Binhong,Wu Jianfei,Zhao Wenxin,Li Bo,Liu Hainan,Guan Chongjie,Feng Shiwei,Luo Jiajun,Ye Tianchun
Funder
National Natural Science Foundation of China
Youth Innovation Promotion Association, Chinese Academy of Sciences
Guangdong Greater Bay Area Institute of Integrated Circuit and System
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Microcontroller susceptibility variations to EFT burst during accelerated aging;Wu;Microelectron. Reliab.,2016
2. EMC of Analog Integrated Circuits;Redoute,2010
3. Investigation on RFI effects in bandgap voltage references;Fiori;Microelectron. J.,2004
4. Study on EMC Susceptibility Mechanism of Integrated Circuit LDO Regulators [D];Wu,2013
5. Large domain validity of MOSFET microwave-rectification response[C];Pouant,2015
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