Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing-Reference-Cited by-同舟云学术

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Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing

Published:2020-11 Issue: Volume:114 Page:113913
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Auchlin Maxime,Marozau Ivan,Bayat Dara Z.,Marchand Laurent,Gass Volker,Sereda Olha

Funder

European Space Agency

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. EEE COTS Compon. - ESA Approach;Nikulainen,2019

2. 2009 Int. Semicond. Conf;Bazu,2009

3. 2007 Int. Semicond. Conf;Bazu,2007

4. 2007 13th Int. Workshop Therm. Investig. ICs Syst. THERMINIC;Szucs,2007

5. 2017 16th IEEE Intersoc. Conf. Therm. Thermomechanical Phenom. Electron. Syst. ITherm;Lall,2017

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1. Reliability of MEMS inertial devices in mechanical and thermal environments: A review;Heliyon;2024-03

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