On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation-Reference-Cited by-同舟云学术

On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation

Published:2020-11 Issue: Volume:114 Page:113838
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ciappa Mauro,Pocaterra Marco

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Predicting cosmic ray-induced failures in silicon carbide power devices;Akturk;IEEE Trans. Nucl. Sci.,2019

2. Schottky diode derating for survivability in a heavy ion environment;Casey;IEEE Trans. Nucl. Sci.,2015

3. Characterization of the pre-breakdown phenomena in silicon carbide power devices by the use of radioactive gamma sources;Ciappa,2020

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1. A Novel Non-Invasive Cryostatic Spectrometry Technique to Characterize the Carriers’ Multiplication Factor in Silicon Carbide Power Devices;Materials Science Forum;2023-06-05

2. Impact of Temperature on Neutron Irradiation Failure-in-Time of Silicon and Silicon Carbide Power MOSFETs;Radiation;2023-05-30

3. Characterization of the carriers' multiplication in Si and SiC power devices by soft-gamma irradiation under cryostatic conditions;Microelectronics Reliability;2022-11

4. TCAD investigation of the transport of carriers deposited by alpha particles in silicon carbide power Schottky devices;Microelectronics Reliability;2021-11

5. Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation;2021 IEEE International Reliability Physics Symposium (IRPS);2021-03