Dynamic optical beam induced current variation mapping: A fault isolation technique-Reference-Cited by-同舟云学术

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Dynamic optical beam induced current variation mapping: A fault isolation technique

Published:2020-04 Issue: Volume:107 Page:113603
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Thor M.H.,Goh S.H.,Yeoh B.L.,Hao Hu,Chan Y.H.,Lin Zhao

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Laser beam carrier injection technique for CMOS LSI failure analysis using an OBIC: light-induced state transition (LIST) method;Kohno,1997

2. Advanced LIVA-TIVA techniques;Falk,2001

3. MN Wu, “Functional OBIC analysis”, US Patent, US5905381A, 1999.

4. Soft defect localization (SDL) on ICs;Bruce,2002

5. Debugging MBIST hard fails without bitmapping;Yeoh,2015

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectrally resolved optical beam-induced current imaging of ESD induced defects on VCSELs;OSA Continuum;2021-02-04

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