Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions-Reference-Cited by-同舟云学术

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Published:2009-12 Issue:12 Volume:49 Page:1515-1519
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Hisaka Takayuki,Sasaki Hajime,Nogami Yoichi,Hosogi Kenji,Yoshida Naohito,Villanueva A.A.,del Alamo Jesus A.,Hasegawa Shigehiko,Asahi Hajime

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

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2. Kanaya K, Kawakami K, Hisaka T, Ishikawa T, Sakamoto S. In: IEEE MTT-S, vol. 2; 2002. p. 1249.

3. Chaki S, Hisaka T, Hirai T, Sasaki Y, Sakamoto S, Mitsui Y. In: APMC, vol. 1; 2001. p. 284.

4. Kunii T, Yoshida N, Miyakuni S, Shiga T, Oku T, Kitano T, et al. In: Microwave symposium digest IEEE MTT-S, vol. 3; 1997. p. 1187.

5. Aihara I, Kitano T, Miyawaki K. Mitsubishi electric technical report 2006; 47 [in Japanese].

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