Author:
Liao Joy Y.,Ton Tung,Slattengren Nathan,Kasapi Steven,Lo William K.,Marks Howard L.,Ng Yin S.,Lundquist Ted
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference2 articles.
1. Ng Yin S, Lo W, Wilsher K. Next generation laser voltage probing. In: Proceeding, international symposium on testing and failure analysis; 2008. p. 249.
2. Wilsher KR, Lo WK. Practical optical waveform probing of flip-chip CMOS devices. In: Proceedings, international test conference (ITC); 1999. p. 934.