Life-time estimation of high-power blue light-emitting diode chips-Reference-Cited by-同舟云学术

Life-time estimation of high-power blue light-emitting diode chips

Published:2009-09 Issue:9-11 Volume:49 Page:1231-1235
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Kang Jeung-Mo,Kim Jae-Wook,Choi Jeong-Hyeon,Kim Du-Hyun,Kwon Ho-Ki

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. A review on the reliability of GaN-based LEDs;Meneghini;IEEE Trans Dev Mater Reliab,2008

2. Accelerated life test of high brightness light emitting diodes;Trevisanello;IEEE Trans Dev Mater Reliab,2008

3. Degradation of GaN-based quantum well light-emitting diodes;Zhao;J Appl Phys,2008

4. Lifetime estimation of high power white LEDs;Ishizaki;J Light Visible Environ,2007

5. Solid-state lighting: failure analysis of white LEDs;Narendran;J Crys Growth,2004

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