The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology

Author:

Kessarinskiy L.N.,Davydov G.G.,Boychenko D.V.,Artamonov A.S.,Nikiforov A.Y.,Yashanin I.B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. The New Gamma Irradiation Facility at the National Research Nuclear University MEPhI // IEEE NSREC Radiation Effects Data Workshop;Artamonov,2014

2. Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation;Kessarinskiy,2014

3. Ionizing-radiation response of the GaAs/(Al, Ga)as PHEMT: a comparison of gamma- and X-ray results;Gromov;Russ. Microelectron.,2004

4. Automated Test Complex for Operational Amplifier ICS Parametric and Functioning Monitoring;Demidova,2015

5. Automatic Test Complex for Parametric Control of Power NMOS and PMOS Transistors;Aristova,2015

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