Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Design challenges at 65nm and beyond;Kahng,2007
2. Compact modeling of MOSFET wearout mechanisms for circuit-reliability simulation;Li;IEEE Trans. Device Mater. Reliab.,2008
3. Hot-carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature;Bravaix,2009
4. Abdulazim Amouri, Florent Bruguier, Saman Kiamehr, Pascal Benoit, Lionel Torres, and Mehdi Tahoori. Aging effects in FPGAs: an experimental analysis. In Field Programmable Logic and Applications (FPL), 2014 24th International Conference, on pages 1–4. IEEE, 2014.
5. FLAW: FPGA lifetime awareness;Srinivasan,2006
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献