Laser Voltage Probing (LVP) – Its value and the race against scaling-Reference-Cited by-同舟云学术

Laser Voltage Probing (LVP) – Its value and the race against scaling

Published:2016-09 Issue: Volume:64 Page:294-298
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ganesh Ulrike

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

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2. Polarization difference probing: a new phase detection scheme for laser voltage probing;Lo,2004

3. Investigation of laser voltage probing signals in CMOS transistors;Kindereit,2007

4. Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120nm and 65nm technology;Kindereit;Microelectron. Reliab.,2008

5. Through silicon in-circuit logic analysis for localizing logic pattern failures;Bruce;Microelectron. Reliab.,2012

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